Helium Ion Microscopy

Author: Gregor Hlawacek
Publisher: Springer
ISBN: 3319419900
Size: 31.52 MB
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This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging.

Helium Ion Microscopy

Author: Gregor Hlawacek
Publisher: Springer
ISBN: 3319419900
Size: 15.21 MB
Format: PDF, ePub, Mobi
View: 3839
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John Notte and Jason Huang Abstract The key technologies that comprise the
helium ion microscope are described in detail. ... Helium Ion Microscopy,
NanoScience and Technology, DOI 10.1007/978-3-319-41990-9_1 3 analysis [
10].

The Nanoscience And Technology Of Renewable Biomaterials

Author: Lucian A. Lucia
Publisher: John Wiley & Sons
ISBN: 9781444307481
Size: 71.62 MB
Format: PDF, Kindle
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3.4.3.1 Scanning Electron Microscopy Scanning electron microscopy (SEM)
provides high-resolution topographic ... 3.4.3.2 Helium Ion Microscopy A helium
ion microscope is analogous to an SEM except that helium ions, rather than
electrons ...

Nanotubes And Nanosheets

Author: Ying (Ian) Chen
Publisher: CRC Press
ISBN: 1466598107
Size: 53.85 MB
Format: PDF, Kindle
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An investigation of nickel cobalt oxide nanorings using transmission electron,
scanning electron and helium ion microscopy. Journal of Nanoscience and
Nanotechnology 12, (2012): 1094–1098. Bell, D. Contrast performance: Low
voltage ...

Surface Science Techniques

Author: Gianangelo Bracco
Publisher: Springer Science & Business Media
ISBN: 3642342434
Size: 45.46 MB
Format: PDF, ePub, Docs
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S. Ogawa, T. Iijima, S. Awata, S. Kakinuma, S. Komatani, T. Kanayama, Helium
ion microscope characterization for ... 3D nanolithographic technique, in Ion
Beams in Nanoscience and Technology, Particle Acceleration and Detection, ed.
by R.

Helium Ion Microscopy

Author: David C. Joy
Publisher: Springer Science & Business Media
ISBN: 1461486602
Size: 77.45 MB
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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the ...

Nanoscience And Nanoengineering

Author: Ajit D. Kelkar
Publisher: CRC Press
ISBN: 1482231204
Size: 31.82 MB
Format: PDF
View: 4635
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Scipioni, L., Alkemade, P., Sidorkin, V., Chen, P., Maas, D., and van Veldhoven, E
. The helium ion microscope: Advances in technology and applications. American
Laboratory 41, 26–28, 2009. Bell, D.C., Lemme, M.C., Stern, L.A., Rwilliams, J., ...

Swift Ion Beam Analysis In Nanosciences

Author: Denis Jalabert
Publisher: John Wiley & Sons
ISBN: 1119008735
Size: 55.76 MB
Format: PDF, ePub
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[VAN 02] VANDENBERG J.A., ARMOUR D.G., ZHANG S. et al., “Characterization
by medium energy ion scattering of damage and dopant profiles produced by
ultrashallow B and As implants into Si at different temperatures”, Journal of
Vacuum Science & Technology B, vol. 20, no. ... [VEL 12] VELIGURA V.,
HLAWACEK G., VAN GASTEL R. et al., “Channeling in helium ion microscopy:
Mapping of crystal ...

Handbook Of Charged Particle Optics Second Edition

Author: Jon Orloff
Publisher: CRC Press
ISBN: 9781420045550
Size: 58.48 MB
Format: PDF, ePub, Mobi
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HIM and SEM have some overlapping territory, but they remain complementary
techniques for nanoscience. Helium ion beam microscopy is forging into new
scientific territory, and this new and innovative technology will develop new
science ...

Nanocharacterisation

Author: Angus I Kirkland
Publisher: Royal Society of Chemistry
ISBN: 1782621865
Size: 22.10 MB
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Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods.