Helium Ion Microscopy

Author: Gregor Hlawacek
Publisher: Springer
ISBN: 3319419900
Size: 22.82 MB
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Helium. Ion. Microscope. Fabrication. of. Solid-State. Nanopore. Devices. for.
Biomolecule. Analysis. Osama K. Zahid and Adam R. Hall Abstract Solid-state
nanopores are an emerging technology for the detection and analysis of
biomolecules at the single-molecule level. Consisting of one or more nanometer-
scale apertures in a thin, solid-state membrane, a number of methods have been
utilized to make these devices. However, conventional approaches are either
non-trivial to scale ...

The Nanoscience And Technology Of Renewable Biomaterials

Author: Lucian A. Lucia
Publisher: John Wiley & Sons
ISBN: 9781444307481
Size: 57.56 MB
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Resolution is typically a few microns, and sensitivity is far better for heavy atoms
than for oxygen and carbon (137). Gases in the specimen chamber also scatter
electrons, so variable pressure or 'environmental' EDX analyses almost always
has more background than measurements at high vacuum. 3.4.3.2 Helium Ion
Microscopy A helium ion microscope is analogous to an SEM except that helium
ions, rather than electrons, bombard the specimen. Helium ion microscopes
provides a ...

Nanotubes And Nanosheets

Author: Ying (Ian) Chen
Publisher: CRC Press
ISBN: 1466598107
Size: 32.49 MB
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Effect of sample bias on backscattered ion spectroscopy in the helium ion
microscope. Journal of Vacuum Science & Technology A 28, (2010): 1377–1380.
Behan, G., D. Zhou, M. Boese, R. M. Wang, and H. Z. Zhang. An investigation of
nickel cobalt oxide nanorings using transmission electron, scanning electron and
helium ion microscopy. Journal of Nanoscience and Nanotechnology 12, (2012):
1094–1098. Bell, D. Contrast performance: Low voltage electrons vs. helium ions
.

Surface Science Techniques

Author: Gianangelo Bracco
Publisher: Springer Science & Business Media
ISBN: 3642342434
Size: 19.96 MB
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78. 79. 80. S. Ogawa, T. Iijima, S. Awata, S. Kakinuma, S. Komatani, T. Kanayama
, Helium ion microscope characterization for Cu/low-k interconnects—SE imaging
and focused helium ion beam luminescence detection, in Proceedings of the
Interconnect Technology Conference and 2011 Materials ... A.A. Bettiol, Proton
beam writing: a new 3D nanolithographic technique, in Ion Beams in
Nanoscience and Technology, Particle Acceleration and Detection, ed. by R.
Hellborg et al., pp.

Helium Ion Microscopy

Author: David C. Joy
Publisher: Springer Science & Business Media
ISBN: 1461486602
Size: 38.96 MB
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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the ...

Nanoscience And Nanoengineering

Author: Ajit D. Kelkar
Publisher: CRC Press
ISBN: 1482231204
Size: 50.30 MB
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Scipioni, L., Alkemade, P., Sidorkin, V., Chen, P., Maas, D., and van Veldhoven, E
. The helium ion microscope: Advances in technology and applications. American
Laboratory 41, 26–28, 2009. Bell, D.C., Lemme, M.C., Stern, L.A., Rwilliams, J.,
and Marcus, C.M. Precision cutting and patterning of graphene with helium ions.
Nanotechnology 20, 455301, 2009. Lemme, M.C., Bell, D.C., Williams, J.R., Stern
, L.A., Baugher, B.W.H., Jarillo-Herrero, P., and Marcus, C.M. Etching of graphene
 ...

Swift Ion Beam Analysis In Nanosciences

Author: Denis Jalabert
Publisher: John Wiley & Sons
ISBN: 1119008735
Size: 16.69 MB
Format: PDF
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[VEL 12] VELIGURA V., HLAWACEK G., VAN GASTEL R. et al., “Channeling in
helium ion microscopy: Mapping of crystal orientation”, Beilstein Journal of
Nanotechnology, vol. 3, p. 501, 2012. [VEL 15] VELIGURA V., HLAWACEK G.,
GASTEL R. et al., “Investigation of ionoluminescence of semiconductor materials
using helium ion microscopy”, Journal of Luminescence, vol. 157, p. 321, 2015. [
VIC 90] VICKRIDGE I., AMSEL G., “SPACES: A PC implementation of the
stochastic theory ...

Handbook Of Charged Particle Optics Second Edition

Author: Jon Orloff
Publisher: CRC Press
ISBN: 9781420045550
Size: 66.86 MB
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As a new technique, HIM is just beginning to show promise, and the plethora of
potentially advantageous applications for nanotechnology are yet to be exploited.
Now that commercial instrumentation is available, further work can be ... Helium
ion beam microscopy is forging into new scientific territory, and this new and
innovative technology will develop new science and contribute to the progress in
nanotechnology. FIGURE 9.58 Comparison of secondary electron images
obtained by ...

Nanofabrication

Author: Maria Stepanova
Publisher: Springer Science & Business Media
ISBN: 9783709104248
Size: 17.46 MB
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Abstract The recent successful development of the helium ion microscope has
produced both a new type of microscopy and a new tool for nanoscale
manufacturing. This chapter reviews the first explorations in this new field in
nanofabrication. The studies that utilize the ... changes with exposure to the beam
. In ion beam induced processing (IBIP), the physical and chemical P.F.A.
Alkemade (*) Kavli Institute of Nanoscience, Delft University of Technology, Delft,
The Netherlands e-mail: ...

Nanofabrication Using Focused Ion And Electron Beams

Author: Ivo Utke
Publisher: Oxford University Press
ISBN: 0199920990
Size: 34.80 MB
Format: PDF, ePub, Docs
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REFERENCES. [1] Ward, B. W., J. A. Notte, et al. Helium ion microscope: A new
tool for nanoscale microscopy and metrology. Journal of Vacuum Science &
Technology B 24.6 (2006): 2871–2874. [2] Smith, N. S., P. P. Tesch, et al. A high
brightness source for nano-probe secondary ion mass spectrometry. Applied
Surface Science 255.4 (2008): 1606–1609; Smith, ...