Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461502152
Size: 32.21 MB
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Size: 35.98 MB
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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975.

Practical Scanning Electron Microscopy

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Size: 49.17 MB
Format: PDF
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In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States.

Scanning Electron Microscopy

Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662135620
Size: 32.48 MB
Format: PDF, ePub, Mobi
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The aim of this book is to outline the physics of image formation, electron specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a ...

Microscopy Methods In Nanomaterials Characterization

Author: Sabu Thomas
Publisher: Elsevier
ISBN: 0323461476
Size: 72.16 MB
Format: PDF, Kindle
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This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.