Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph I. Goldstein
Publisher: Springer
ISBN: 1493966766
Size: 23.37 MB
Format: PDF, ePub, Mobi
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However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Size: 17.87 MB
Format: PDF, Mobi
View: 6780
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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975.

Scanning Microscopy For Nanotechnology

Author: Weilie Zhou
Publisher: Springer Science & Business Media
ISBN: 0387396209
Size: 53.17 MB
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J. Goldstein, D. E. Newbury, D. C. Joy, et al., Scanning Electron Microscopy andX
-Ray Microanalysis, 3rd edition, Kluwer Academic/Plenum Publishers, New York
(2003). 3. J. Y. Liu, Microsc. Microanal., 8(Suppl. 2) (2002). 4. D. C. Joy, Microsc.
Microanal., 8(Suppl. 2) (2002). 5. J. Goldstein, D. E. Newbury, D. C. Joy, et al.,
Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition, Kluwer
Academic/Plenum Publishers, New York (2003). Supplemental CD. 6. D. C. Joy
and D.